Early warning failure detection for a lasing semiconductor optical amplifier

ABSTRACT

Optical systems and devices are provided that include or facilitate the ability to provide early detection of the failure of an optical transmitter such as a laser. Such detection may be made with reference to various aspects of the operation and performance of the optical transmitter. For example, some of the optical systems and devices employ wavelength shift information to make determinations concerning potential failure of an optical transmitter. Other optical systems and devices use information concerning the efficiency with which an incoming pump current is converted into the ballast laser signal changes to make determinations concerning potential failure of an optical transmitter.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of, and claims the benefit of, U.S.patent application Ser. No. 10/029,676, now U.S. Pat. No. 6,707,600entitled “Early Warning Failure Detection Within an Optical Network,”and filed Dec. 21, 2001, which, in turn, claims the benefit of U.S.Provisional Patent Application Ser. No. 60/274,470, entitled “EarlyWarning Failure Detection Within an Optical Network,” filed Mar. 9,2001. Both of the above-referenced applications are incorporated hereinin their respective entireties by this reference.

BACKGROUND OF THE INVENTION

1. The Field of the Invention

This invention generally relates to early warning failure detection foroptical amplifiers. More particularly, it relates to early warningfailure detection for lasing semiconductor optical amplifiers, such asvertical lasing semiconductor optical amplifiers (VLSOAs), where thefailure detection is based on detecting a shift in wavelength of aballast laser signal generated by the amplifier.

2. Related Technology

Optical amplifiers are a basic building block for many types of opticalsystems. For example, fiber optic communications systems transmitinformation over optical fibers. A typical communications systemincludes a transmitter, an optical fiber, and a receiver. Thetransmitter incorporates information to be communicated into an opticalsignal and transmits the optical signal via the optical fiber to thereceiver. The receiver recovers the original information from thereceived optical signal. In these systems, phenomena such as fiberlosses, losses due to insertion of components in the transmission path,and splitting of the optical signal may attenuate the optical signal anddegrade the corresponding signal-to-noise ratio as the optical signalpropagates through the communications system. Optical amplifiers areused to compensate for these attenuations. As another example, receiverstypically operate properly only within a relatively narrow range ofoptical signal power levels; optical amplifiers may be used to boost anoptical signal to the proper power range for the receiver.

It is generally beneficial to monitor optical amplifiers to ensure thatthey are operating correctly. For example, one factor in the efficientutilization of an optical network is the ability to detect and correctfailures within the network. Monitoring of optical amplifiers in thenetwork can help locate a point of failure. Early warning beforefailures occur would also be beneficial, as this can be used to preventfailures; optical amplifiers which are identified as subject to failurein the near future can be replaced before they actually fail.

One method typically used to monitor an optical amplifier is based ontapping a small portion of the amplified optical signal leaving theoptical amplifier. If the strength of the tapped portion falls within aspecified range, this is an indication that the optical amplifier isoperating correctly (or at least outputting a signal). In contrast, ifthe tapped portion is unusually weak or non-existent, this suggests thatthe optical amplifier may have failed. However, this approach reducesthe optical signal's strength since a portion of the optical signal istapped for monitoring purposes. As optical networks expand and thenumber of amplifiers in a signal path increases, the cumulative effectof all of these tap losses can be significant. Another drawback to thisapproach is that it does not provide early warning of a future failure.

As a result, there is a need for a failure detection capability foroptical amplifiers which does not introduce tap loss or other types ofoptical loss. There is also a need for a failure detection capabilitywhich provides early warning of failures. In the context of opticalcommunications systems, early warning failure detection would allowre-routing of data traffic away from optical amplifiers before theyfail. Additionally, early warnings provide more time for a networkmanager to replace a failed (or about to fail) optical amplifier.

BRIEF SUMMARY OF AN EXEMPLARY EMBODIMENT OF THE INVENTION

In accordance with the present invention, early warning failuredetection is provided for an optical amplifier. The optical amplifier isbased on a lasing semiconductor optical amplifier, which generates aballast laser signal in addition to the amplified optical signal. Theballast laser signal exhibits a wavelength shift before failure and thiswavelength shift is used as the basis for an early warning of futurefailure of the amplifier.

In one embodiment, the optical amplifier with early warning failuredetection includes a lasing semiconductor optical amplifier coupled to awavelength-sensitive detector. The lasing semiconductor opticalamplifier includes a semiconductor gain medium, an amplifying path whichtraverses the semiconductor gain medium, a laser cavity which includesthe semiconductor gain medium, and a pump input to the semiconductorgain medium. When the semiconductor gain medium is pumped abovethreshold for the laser cavity, the laser cavity generates a laseroutput (i.e., the ballast laser signal) which acts as a ballast for theamplification process. Early warning failure detection is based ondetecting a wavelength shift in the ballast laser signal. Thewavelength-sensitive detector receives the ballast laser signal for thispurpose.

In one implementation, the lasing semiconductor optical amplifier is avertical lasing semiconductor optical amplifier (VLSOA). In anotheraspect of the invention, early warning of failure is indicated by ashift to a longer wavelength. In yet another aspect, thewavelength-sensitive filter is implemented as an optical filter followedby a detector. For example, the pre-shift version of the ballast lasersignal may fall in the stop band of the optical filter and thepost-shift version in the pass band, or vice versa. In yet anothervariation, a VLSOA, optical filter and detector are implemented aslayers of different materials stacked on a common substrate, thusyielding an integrated device.

In another aspect of the invention, the efficiency with which anincoming pump current is converted into the ballast laser signalchanges, typically decreasing, before failure and this change inconversion efficiency is used as the basis for an early warning offuture failure of the amplifier. In one approach, the pump current isheld constant and a decrease in the ballast laser signal then indicatesa decrease in the conversion efficiency. In another approach, the pumpcurrent is adjusted so that the ballast laser signal is held constant.An increase in the amount of pump current required then indicates adecrease in the conversion efficiency.

The present invention is particularly advantageous because it providesearly warning of future failure, thus allowing proactive steps to betaken before the actual failure of the optical amplifier. In addition,the early warning is provided without diverting a portion of theamplified signal. Thus, no tap loss is introduced.

Other aspects of the invention include methods based on the above andsystems which include optical amplifiers with early warning failuredetection capability. Examples of such systems include fiber opticcommunications systems, transmitters, receivers, and switching nodes.

BRIEF DESCRIPTION OF THE DRAWINGS

Exemplary embodiments of the invention include other aspects which willbe more readily apparent from the following detailed description of theinvention and the appended claims, when taken in conjunction with theaccompanying drawings, in which:

FIG. 1 is a diagram of a vertical lasing semiconductor optical amplifier(VLSOA).

FIG. 2 is a flowchart showing the operation of a VLSOA used as anamplifier.

FIG. 3A is a perspective view of one embodiment of a VLSOA.

FIG. 3B is a detailed transverse cross-sectional view of one embodimentof a VLSOA.

FIG. 3C is a longitudinal cross-sectional view of one embodiment of aVLSOA.

FIG. 4 is a functional block diagram of an optical amplifier with earlywarning failure detection.

FIG. 5 is a flow diagram illustrating operation of an optical amplifierwith early warning failure detection.

FIGS. 6A-6D are spectral diagrams illustrating early warning failuredetection based on optical filtering.

FIGS. 7A-7C are block diagrams of various embodiments of processingcircuitry for early warning failure detection.

FIG. 8 is a perspective view of one implementation of an opticalamplifier with early warning failure detection.

FIG. 9 is a perspective view of another implementation of an opticalamplifier with early warning failure detection.

FIGS. 10-12 are diagrams of various fiber optic communications systemsusing optical amplifiers with early warning failure detection.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS OF THE INVENTION

FIG. 1 is a diagram of a lasing semiconductor optical amplifier (lasingSOA) 100 in accordance with the present invention. The lasing SOA 100has an amplifier input 112 and an amplifier output 114. The lasing SOA100 further includes a semiconductor gain medium 120, with an amplifyingpath 130 coupled between the amplifier input 112 and the amplifieroutput 114 of the lasing SOA 100 and traversing the semiconductor gainmedium 120. The lasing SOA 100 further includes a laser cavity 140including the semiconductor gain medium 120, and a pump input 150 to thesemiconductor gain medium 120. Different geometries are possible. In avertical lasing semiconductor optical amplifier (VLSOA), the lasercavity 140 is oriented vertically with respect to the amplifying path130. In transverse and longitudinal lasing SOAs, the laser cavity isoriented transversely or longitudinally (i.e., in-line), respectively,with respect to the amplifying path 130. The pump input 150 is forreceiving a pump to pump the semiconductor gain medium 120 above alasing threshold for the laser cavity 140.

FIG. 2 is a flow diagram illustrating operation of lasing SOA 100 whenit is used as an amplifier. The lasing SOA 100 receives 210 an opticalsignal at its amplifier input 112. The optical signal propagates 220along the amplifying path 130. The pump received at pump input 150 pumps230 the semiconductor gain medium above a lasing threshold for the lasercavity 140, thus generating a laser field. For reasons which will beapparent below, this lasing field shall be referred to as a ballastlaser signal. It mayor may not be output from the lasing SOA 100 (e.g.,it may be absorbed rather than output). When lasing occurs, theround-trip gain offsets the round trip losses for the laser cavity 140.In other words, the gain of the semiconductor gain medium 120 is clampedto the gain value necessary to offset the round-trip losses. The opticalsignal is amplified 240 according to this gain value as it propagatesalong the amplifying path 130 (i.e., through the semiconductor gainmedium 120). The amplified signal exits the lasing SOA 100 via theamplifier output 114.

Note that the gain experienced by the optical signal as it propagatesthrough the lasing SOA 100 is determined in part by the gain value ofthe semiconductor gain medium 120 (it is also determined, for example,by the length of the amplifying path 130) and this gain value, in turn,is determined primarily by the lasing threshold for the laser cavity140. In particular, the gain experienced by the optical signal as itpropagates through the lasing SOA 100 is substantially independent ofthe amplitude of the optical signal. This is in direct contrast to thesituation with non-lasing SOAs and overcomes the distortion andcrosstalk disadvantages typical of non-lasing SOAs.

FIGS. 3A-3C are a perspective view, transverse cross-section, andlongitudinal cross-section, respectively, of one embodiment of a VLSOA300 according to the present invention, with FIG. 3B showing the mostdetail.

Referring to FIG. 3B and working from bottom to top in the verticaldirection (i.e., working away from the substrate 302), VLSOA 300includes a bottom mirror 308, bottom cladding layer 305, active region304, top cladding layer 307, confinement layer 319, and a top mirror306. The bottom cladding layer 305, active region 304, top claddinglayer 307, and confinement layer 319 are in electrical contact with eachother and may be in direct physical contact as well. An optional deltadoping layer 318 is located between the top cladding layer 307 andconfinement layer 319. The confinement layer 319 includes a confinementstructure 309, which forms aperture 315. The VLSOA 300 also includes anelectrical contact 310 located above the confinement structure 309, anda second electrical contact 311 formed on the bottom side of substrate302.

Comparing to FIG. 1, the semiconductor gain medium 120 includes theactive region 304 and the laser cavity 140 is formed primarily by thetwo mirrors 306 and 308 and the active region 304. This embodiment iselectrically pumped so the pump input 150 includes the electricalcontacts 310,311.

VLSOA 300 is a vertical lasing semiconductor optical amplifier since thelaser cavity 340 is a vertical laser cavity. That is, it is orientedvertically with respect to the amplifying path 330 and substrate 302.The ballast laser signal produced by the laser cavity 340 may be outputthrough either end of the laser cavity (i.e., through top surface 320and/or through the substrate 302). The VLSOA 300 preferably is long inthe longitudinal direction, allowing for a long amplifying path 330 and,therefore, more amplification. The entire VLSOA 300 is an integralstructure formed on a single substrate 302 and may be integrated withother optical elements. In most cases, optical elements which arecoupled directly to VLSOA 300 will be coupled to the amplifying path 330within the VLSOA. Depending on the manner of integration, the amplifierinput 312 and amplifier output 314 may not exist as a distinct structureor facet but may simply be the boundary between the VLSOA 300 and otheroptical elements. Furthermore, although this disclosure discusses theVLSOA 300 primarily as a single device, the teachings herein applyequally to arrays of devices.

VLSOA 300 is a layered structure, meaning that it is made up of layersof different materials stacked on substrate 302. This allows the VLSOA300 to be fabricated using standard semiconductor fabricationtechniques, preferably including organo-metallic vapor phase epitaxy(OMVPE) or organometallic chemical vapor deposition (OMCVD). Othercommon fabrication techniques include molecular beam epitaxy (MBE),liquid phase epitaxy (LPE), photolithography, e-beam evaporation,sputter deposition, wet and dry etching, wafer bonding, ionimplantation, wet oxidation, and rapid thermal annealing, among others.

The optical signal amplified by the VLSOA 300 is confined in thevertical direction by index differences between bottom cladding 305,active region 304, and top cladding 307, and to a lesser extent by indexdifferences between the substrate 302, bottom mirror 308, confinementlayer 319, and top mirror 306. Specifically, active region 304 has thehigher index and therefore acts as a waveguide core with respect tocladding layers 305,307. The optical signal is confined in thetransverse direction by index differences between the confinementstructure 309 and the resulting aperture 315. Specifically, aperture 315has a higher index of refraction than confinement structure 309. As aresult, the mode of the optical signal to be amplified is generallyconcentrated in dashed region 321. The amplifying path 330 is throughthe active region 304 in the direction in/out of the plane of the paperwith respect to FIG. 3B.

The choice of materials system will depend in part on the wavelength ofthe optical signal to be amplified, which in turn will depend on theapplication. Wavelengths in the approximately 1.3-1.6 micron region arecurrently preferred for telecommunications applications, due to thespectral properties of optical fibers. The approximately 1.28-1.35micron region is currently also preferred for data communications oversingle mode fiber, with the approximately 0.8-1.1 micron region being analternate wavelength region. The term “optical” is meant to include allof these wavelength regions. In a preferred embodiment, the VLSOA 300 isoptimized for the 1.55 micron window.

In one embodiment, the active region 304 includes a multiple quantumwell (MQW) active region. MQW structures include several quantum wellsand quantum wells have the advantage of enabling the formation of laserswith relatively low threshold currents. In alternate embodiments, theactive region 304 may instead be based on a single quantum well or adouble-heterostructure active region. The active region 304 may be basedon various materials systems, including for example InAlGaAs on InPsubstrates, InAlGaAs on GaAs, InGaAsP on InP, GaInNAs on GaAs, InGaAs onternary substrates, and GaAsSb on GaAs. Nitride material systems arealso suitable. The materials for bottom and top cladding layers 305 and307 will depend in part on the composition of active region 304.

Examples of top and bottom mirrors 306 and 308 include Bragg reflectorsand non-Bragg reflectors such as metallic mirrors. Bottom mirror 308 inFIG. 3 is shown as a Bragg reflector. Top mirror 306 is depicted as ahybrid mirror, consisting of a Bragg reflector 317 followed by ametallic mirror 313. Bragg reflectors may be fabricated using variousmaterials systems, including for example, alternating layers of GaAs andAlAs, SiO₂ and TiO₂, InAlGaAs and InAlAs, InGaAsP and InP, AlGaAsSb andAlAsSb or GaAs and AlGaAs. Gold is one material suitable for metallicmirrors. The electrical contacts 310,311 are metals that form an ohmiccontact with the semiconductor material. Commonly used metals includetitanium, platinum, nickel, germanium, gold, palladium, and aluminum. Inthis embodiment, the laser cavity is electrically pumped by injecting apump current via the electrical contacts 310, 311 into the active region304. In particular, contact 310 is a p-type contact to inject holes intoactive region 304, and contact 311 is an n-type contact to injectelectrons into active region 304. Contact 310 is located above thesemiconductor structure (i.e., above confinement layer 319 and thesemiconductor part of Bragg reflector 317, if any) and below thedielectric part of Bragg reflector 317, if any. For simplicity, in FIG.3, contact 310 is shown located between the confinement layer 319 andBragg reflector 317, which would be the case if Bragg reflector 317 wereentirely dielectric. VLSOA 300 may have a number of isolated electricalcontacts 310 to allow for independent pumping within the amplifier. Thisis advantageous because VLSOA 300 is long in the longitudinal directionand independent pumping allows, for example, different voltages to bemaintained at different points along the VLSOA. Alternately, thecontacts 310 may be doped to have a finite resistance or may beseparated by finite resistances, rather than electrically isolated.

Confinement structure 309 is formed by wet oxidizing the confinementlayer 319. The confinement structure 309 has a lower index of refractionthan aperture 315. Hence, the effective cross-sectional size of lasercavity 340 is determined in part by aperture 315. In other words, theconfinement structure 309 provides lateral confinement of the opticalmode of laser cavity 340. In this embodiment, the confinement structure309 also has a lower conductivity than aperture 315. Thus, pump currentinjected through electrical contact 310 will be channeled throughaperture 315, increasing the spatial overlap with optical signal 321. Inother words, the confinement structure 309 also provides electricalconfinement of the pump current.

As lasing SOAs approach failure, there is a shift in the wavelength ofthe ballast laser signal. The remainder of this disclosure shall bedescribed in the context of VLSOAs and a shift to a longer wavelengthbut it is to be understood that the invention is not limited to thisscenario. It is equally applicable to other types of lasing SOAs,including both the transverse and longitudinal geometries, and to casesin which the shift is to a shorter wavelength.

In certain cases, the cause of the wavelength shift may be an increasein temperature within the VLSOA. In other words, as the VLSOA begins tofail, its temperature increases, thus causing the wavelength shift.Regardless of the cause, the wavelength shift may be used as an earlywarning device to identify VLSOAs just prior to their actual failure.The wavelength shift typically accelerates with time as the failure modeof the VLSOA becomes more pronounced. Small wavelength shifts (e.g., of0.1 nm) may be detected significantly in advance of failures (possiblyeven months before the actual failure) and much larger wavelength shiftscan occur minutes or even seconds before the failure.

FIG. 4 is a functional block diagram of an optical amplifier 400 withearly warning failure detection. The optical amplifier 400 includes aVLSOA 405 and a wavelength-sensitive detector 470. Thewavelength-sensitive detector 470 is coupled to receive the ballastlaser signal 425 from VLSOA 405. The wavelength-sensitive detector 470detects the wavelength shift in the ballast laser signal 425, thuspermitting early warning of a future failure of the VLSOA 405.

In the implementation shown in FIG. 4, the wavelength-sensitive detector470 includes an optical filter 430 coupled to a detector 440. Theoptical filter 430 has a spectral response which varies with wavelength.In particular, the spectral response is selected in order to detect theshift in wavelength. Examples of optical filters include thin-filmresonant cavity filters, thin-film multicavity filters, and arrayedwaveguide grating type filters. The optical filter 430 may be integratedwith VLSOA 405, directly coupled to VLSOA 405 or implemented ascomponents which are discrete from VLSOA 405. Examples of detectors 440include PIN diodes and avalanche photodetectors. Examples ofwavelength-sensitive detectors 470 which do not consist of an opticalfilter 430 combined with a detector 440 are detectors whose inherentspectral sensitivity is suitable for detecting the wavelength shift.

In alternate embodiments, early warning of a future failure is based onobserving the ballast laser signal 425, but not on detecting awavelength shift. For example, the ballast laser signal 425 can bemonitored for a change in the efficiency of converting the incoming pumpcurrent to the ballast laser signal 425. Assume for the moment that theamplitude of the incoming optical signal is constant or that there is noincoming optical signal so that variations in the amplitude of theballast laser signal are not caused by variations in the incomingoptical signal. In one implementation, efficiency is monitored by usinga constant pump current. A decrease in the ballast laser signal 425 thenindicates a decrease in the conversion efficiency from pump current toballast laser signal 425. This, in turn, is often an early indication offuture failure. Alternately, the pump current can be adjusted so thatthe ballast laser signal 425 has a constant strength. An increase in theamount of pump current required means there has been a decrease in theconversion efficiency, again signaling possible future failure of thedevice.

The optical amplifier 400 of FIG. 4 can be straightforwardly adapted toimplement this type of early warning. For example, the optical filter430 may be removed. If a constant pump current is applied, then thedetector output 445 serves as an early warning signal. If a constantballast laser signal 425 is maintained, then the pump current (or anindication of the amount of pump current required to maintain theconstant strength ballast laser signal 425) serves as the early warningsignal. As with the wavelength-sensitive approach, the detector 440 canbe integrated on chip with the VLSOA, placed inside a common packagewith the VLSOA, and/or coupled to the VLSOA via free space optics, beamsplitters, mirrors, filters, guided wave optics, fibers, etc. As withthe wavelength-sensitive approach, although the above example uses aVLSOA, this approach also applies to lasing SOAs which utilize othergeometries (including transverse and longitudinal geometries).

Returning now to the wavelength-sensitive case, FIG. 5 is a flow diagramillustrating operation of amplifier 400. The VLSOA 405 is pumped 510above a lasing threshold for the VLSOA. As a result, the VLSOA 405generates a ballast laser signal 425. VLSOA 405 also has an amplifierinput 412 and an amplifier output 414. An optical signal enters theVLSOA 405 via amplifier input 412, where it is amplified and transmittedvia amplifier output 414. The ballast laser signal 425 acts as a ballastwith respect to the amplification process, thus gain-clamping the VLSOA.When the VLSOA 405 is functioning properly, the wavelength of theballast laser signal 425 falls within some normal operating range. Whenthe VLSOA 405 is approaching failure, the wavelength of the ballastlaser signal 425 experiences a pre-failure shift. Thewavelength-sensitive detector 470 monitors 520 the ballast laser signalfor the pre-failure shift.

FIGS. 6A-6D are spectral diagrams illustrating early warning failuredetection based on optical filtering. These examples use the filter430—detector 440 implementation shown in FIG. 4. In other words, as aspecial case of step 520, the optical filter 430 filters 522 the ballastlaser signal 425. The detector 440 monitors 524 the amplitude of thefiltered signal 435.

For convenience, the symbol λ is used to denote a normal operatingwavelength and λ+δ to denote a shifted wavelength. The use of thevariable δ is not meant to imply that the shift in wavelength occurs asa discrete jump. In other words, it is not meant to imply that thewavelength jumps from λ to λ+δ prior to failure. Typically, but notalways, the wavelength varies continuously instead, at some pointreaching and then passing λ+δ. Thus, the quantity δ can be thought of asa threshold for early warning failure detection. Positive δ indicates ashift to longer wavelengths and negative δ indicates a shift to shorterwavelengths. In one embodiment, the operating wavelength λ falls in therange of approximately 1.3-1.6 micron (i.e., the wavelength rangecurrently used for telecommunications) and the threshold δ is in therange of 1-15 nm.

In FIGS. 6A-6D, the spectrum of the ballast laser signal during normaloperation lies in the vicinity of λ and is shown by curve 610. Thespectrum after the wavelength shift to λ+δ is shown by curve 620. Thespectral response of the optical filter 430 is shown by curves 630A-D,respectively.

In FIGS. 6A and 6B, the post-shift wavelength λ+δ lies in the pass bandof the optical filter 430; whereas the operating wavelength λ lies inthe stop band. In FIG. 6A, the optical filter 430 is a bandpass filterwith one edge located between wavelengths λ and λ+δ and the other edgelocated at a wavelength longer than λ+δ. In FIG. 6B, the optical filter430 is a lowpass filter with edge located between wavelengths λ and λ+δ.

Both of these examples function similarly. A properly functioning VLSOA405 generates a ballast laser signal 425 with spectrum 610. Since thespectrum 610 falls primarily in the stop band of the optical filter 430,it is significantly attenuated. A weak optical signal 435 is received bydetector 440, which then outputs a correspondingly weak electricalsignal 445. Comparatively, when the VLSOA 405 begins to fail, thespectrum of ballast laser signal 425 shifts. Curve 620 shows thespectrum after it has shifted by an amount δ. As a result of thiswavelength shift, more of the spectrum falls in the pass band of theoptical filter 430. Detector 440 converts the stronger optical signal435 into a stronger electrical signal 445. Thus, as the VLSOA 405approaches failure, the electrical signal 445 produced by detector 440increases.

In FIGS. 6C-6D, the opposite approach is taken. The post-shiftwavelength λ+δ lies in the stop band of the optical filter; whereas theoperating wavelength λ lies in the pass band. In FIG. 6C, the opticalfilter 430 is a bandpass filter with one edge located betweenwavelengths λ and λ+δ and the other edge located at a wavelength shorterthan λ. In FIG. 6D, the optical filter 430 is a highpass filter withedge located between wavelengths λ and λ+δ.

In these two examples, a properly functioning VLSOA 405 generates aballast laser signal 425 with a spectrum 610 which falls primarily inthe pass band of the optical filter 430. However, when the VLSOA 405begins to fail, the spectrum of the ballast laser signal 425 shiftstowards the stop band. As a result of this wavelength shift, the opticalsignal 435 received by detector 440 falls in strength. Thus, as theVLSOA 405 approaches failure, the electrical signal 445 produced bydetector 440 decreases.

FIGS. 7A-7C are block diagrams of various types of processing circuitrysuitable for analyzing the early warning electrical signals 445generated by optical amplifier 400. The processing circuitry basicallymonitors the signal for an increase/decrease which would indicate afuture failure of VLSOA 405. The following examples are discussedassuming that an increase in the electrical signal 445 indicates anearly warning for VLSOA failure, but the same principles apply to thecase of a decrease also.

In FIG. 7A, the optical amplifier 400 is coupled to the followingelements in series: a comparator 710, processor 720 and early warningfailure indicator 730. Examples of comparator 710 include analogcircuitry, digital circuitry (assuming an A/O conversion), andcomparison functionality implemented in software. Examples of processor720 include general purpose processors, DSP processors, microcontrollers, and logic circuitry (e.g., as a stand-alone chip orintegrated as a part of a larger chip). Examples of early warningfailure indicator 730 include light emitting diodes, display icons oncomputer screens, and the activation of messages or software routines.In FIG. 7A, the comparator 710 compares the incoming early warningsignal 445 to a reference threshold 715. The threshold may be eitherstatic or dynamic (e.g., adaptive). When the threshold is exceeded, thecomparator 710 signals detection of a shift in wavelength, for exampleby toggling its output. The processor 720 then activates the earlywarning failure indicator 730.

In FIG. 7B, there are two optical amplifiers 400A and 400B coupled tocomparator 710. The early warning signals 445A and 445B from the opticalamplifiers 400 are compared by comparator 710. If the two signals 445are approximately equal, then it is assumed that both VLSOAs 405 arefunctioning properly. However, if the two signals 445 differ by toomuch, then comparator 710 signals the processor 720, which activates theearly warning failure indicator 730.

In FIG. 7C, the processor 720 implements the comparison function. Theearly warning signal 445 is converted from analog to digital form by A/Dconverter 712 and then received by processor 720, which implements thelogic necessary to determine whether to activate the early warningfailure indicator 730.

FIG. 8 is a perspective view of one implementation of an opticalamplifier. In this embodiment, a VLSOA 405, optical filter 430 anddetector 440 are integrated on a common substrate. The VLSOA 405 has thestructure shown in FIG. 3, although not as much detail is shown in FIG.8 for purposes of clarity. The VLSOA 405 outputs the ballast lasersignal 425 through its top surface 320. Some or all of this ballastlaser signal 425 enters the optical filter 430.

The optical filter 430 is implemented as a Fabry-Perot filter integrateddirectly above the top surface 320 of the VLSOA 405. The Fabry-Perotfilter 430 includes two mirrors 820 and 830 separated by an opticalcavity 825. In this example, the mirrors 820 and 830 are InP/InGaAsPBragg mirrors. The cavity 825 is formed from typical materials such asInP, InGaAsP or InGaAs, and it typically has an optical path lengthwhich is an integer number of half wavelengths. Examples of othermaterials suitable for use in cavity 825, mirror 820 and mirror 830include other semiconductor materials (e.g., InP/InGaAs, GaAs/AlGas,AlInGaAs, AlN, InGaAsN, GaN, Si, and amorphous-Si), dielectric materials(e.g., SiO2, MgO and A1203) and polymer materials. The ballast lasersignal 425 emitted through the VLSOA top surface 320 enters the firstmirror 820 at a right angle to its surface. The light resonates withinthe cavity 825, causing only the resonant wavelengths to add in phase.The length of the cavity 825 determines the resonant wavelengths. Theresonant wavelengths are transmitted through the second mirror 830 tothe detector 440.

The detector 440 is integrated directly above the Fabry-Perot filter430. In the example of FIG. 8, the detector 440 is a PIN detector. Frombottom to top, it includes a bottom cladding layer 840 which is either nor p doped, an undoped or intrinsic absorbing layer 845, and a topcladding layer 850 which has the opposite doping as the bottom claddinglayer 840. Electrical contacts 842 and 852 are made to the bottom andtop cladding layers 840 and 850, respectively. In the example shown inFIG. 8, the top and bottom cladding layers 840-850 are InP and theabsorbing layer 845 is InGaAs. The filtered ballast laser signal isabsorbed in the lower bandgap intrinsic layer 845 and electron-holepairs are generated. The built-in field surrounding the p-i-n junctionsweeps out the holes to the higher bandgap p-region and the electrons tothe higher band gap n-region and thus generates a current between thetwo electrical contacts 842, 852. The built-in field can be enhanced byreverse biasing the p-i-n junction. The generated current serves as theearly warning signal 445. If the filter 430 is electrically conductive,the top electrical contact 310 to the VLSOA 405 (see FIG. 3B) and thebottom electrical contact 842 to the detector 440 may be implemented asa single contact.

FIG. 9 is a perspective view of another implementation of an opticalamplifier, in which the VLSOA 405, optical filter 430 and detector 440are discrete components. The amplifier input and output of the VLSOA 405are coupled to fiber pigtails 912 and 914. A lens 920 collects some orall of the ballast laser signal 425 generated by VLSOA 405 and depositsit onto the detector 440. An aperture 910 placed over the top surface320 of VLSOA 405 defines the extent of the ballast laser signal 425which is collected by the lens 920. The optical filter 430 is located inthe optical path between the VLSOA 405 and the detector 440. Thediscrete elements are held in position using conventionalopto-mechanical packaging techniques.

FIGS. 10-12 are diagrams of example fiber optic communications systemswhich use optical amplifiers with early warning failure detection. FIG.10 depicts a transmitter system, FIG. 11 depicts a receiver system, andFIG. 12 depicts a node for a fiber optic network. These are examples ofvarious components in a fiber optic communications system. One task inoverall network management is the detection and correction of devicefailures within the network. These failures may result in a large amountof data being lost. As a result, a network manager must respond quicklyto minimize the amount of lost data. In the event of a failure, thenetwork manager typically identifies the source of the failure, routesdata traffic around the failure, and repairs the failure. Early warningbefore the occurrence of a failure allows the network manager to takeproactive steps instead. For example, he may re-route traffic and thenreplace the optical amplifier when it is not handling live data. Thisavoids loss of data and also gives the network manager more time andflexibility as to when to replace the optical amplifier.

Beginning with FIG. 10, transmitter system 1000 includes input ports1002A-N, an output port 1004, and an optical transmitter 1050 couplingthe input ports 1002 to the output port 1004. In this particularexample, the optical transmitter 1050 further includes two electricalmultiplexers 1052A and 1052B, two electro-optic modulators 1054A and1054B, two lasers 1056A and 1056B, and a wavelength division multiplexer1058. Each electrical multiplexer couples some of the input ports 1002to the electrical input of one of the electro-optic modulators 1054. Thelasers 1056 provide the optical input to the modulator 1054. The outputsof the two modulators 1054 are coupled to the wavelength divisionmultiplexer 1058, which is coupled to the output port 1004.

The optical transmitter system 1000 operates as follows. In general,each input port 1002 receives data, which is combined by the opticaltransmitter 1050 and output as an optical signal via the output port1004. In this particular implementation, each electrical multiplexer1052 combines some of the incoming data signals into an electricalsignal which drives the corresponding modulator 1054. Each modulator1054 impresses the data onto the laser signal produced by thecorresponding laser 1056. The two lasers 1056 operate at differentwavelengths. The wavelength division multiplexer 1058 combines the twomodulated optical signals into a single optical signal, which istransmitted via output port 1004.

Optical transmitter system 1000 also includes optical amplifiers 400,which are located wherever amplification is beneficial. The exactlocations will depend on the overall system design. The exact locationswill depend on the overall system design. The optical amplifier symbols400 shown in FIG. 10 show examples of where an optical amplifier may belocated, but they do not imply that there must be an optical amplifierat every location shown. In FIG. 10, optical amplifiers 400 are shownbetween lasers 1056 and modulators 1054, in order to amplify the lasersignals generated by the laser 1056. They are located between themodulators 1054 and the wavelength division multiplexer 1058, in orderto amplify the single-wavelength modulated optical signals produced bythe modulators 1054. An optical amplifier 400 is also located after thewavelength division multiplexer 1058, in order to amplify themulti-wavelength modulated optical signal. The optical amplifiersdescribed previously are suitable for use in the optical transmittersystem 1000. The optical amplifiers 400 include early warning failuredetection and generate early warning signals 445. These signals 445 arerouted to management system 1040, which monitors the status of theoptical amplifiers 400 and takes appropriate actions when an earlywarning signal 445 indicates future failure.

In FIG. 11, receiver system 1100 includes an input port 1104, a numberof output ports 1102A-N, and an optical receiver 1150 coupling the inputport 1104 to the output ports 1102. In this particular example, theoptical receiver 1150 includes a wavelength division demultiplexer 1158,two detectors 1154A and 1154B, and two electrical demultiplexers 1152Aand 1152B. The wavelength division demultiplexer 1158 couples the inputport 1104 to the detectors 1154. Each electrical demultiplexer 1152couples one of the detectors 1154 to the output ports 1102.

The optical receiver system 1100 generally implements the reversefunctionality of optical transmitter system 1000. The input port 1102receives an optical signal which contains modulated data at multiplewavelengths (two wavelengths in this example). The wavelength divisiondemultiplexer 1158 separates the wavelengths, feeding one to eachdetector 1154. The detectors 1154 recover electrical signals from theincoming modulated optical signals. These electrical signals are furthersplit by electrical demultiplexers 1152 and then output at ports 1102.

Optical receiver system 1100 also includes optical amplifiers 400, whichare located wherever amplification is necessary. In FIG. 11, an opticalamplifier 400 is shown before wavelength division demultiplexer 1158, inorder to amplify the incoming multi-wavelength modulated optical signal.Optical amplifiers 400 are also shown between wavelength divisiondemultiplexer 1158 and detectors 1154, in order to amplify thesingle-wavelength modulated optical signals produced by the wavelengthdivision demultiplexer 1158. As with FIG. 10, the optical amplifiers 400in FIG. 11 include early warning failure detection and generate earlywarning signals 445. These signals 445 are routed to management system1140, which monitors the status of the optical amplifiers 400 and takesappropriate actions when an early warning signal 445 indicates futurefailure.

FIG. 12 depicts a node 1200 for a fiber optic network. The node includesa high-speed input port 1214, a high-speed output port 1204, low-speedinput ports 1202 and low-speed output ports 1212. The ports are coupledto each other by an add-drop multiplexer 1250. In this example, theadd-drop multiplexer 1250 includes a wavelength division demultiplexer1252, an optical switch 1254 and a wavelength division multiplexer 1256.The wavelength division demultiplexer 1252 is coupled between thehigh-speed input port 1214 and the optical switch 1254. The wavelengthdivision multiplexer 1256 is coupled between the optical switch 1254 andthe high-speed output port 1204. The low speed ports 1202,1212 are alsocoupled to the optical switch 1254.

The high-speed ports 1204,1214 handle optical signals which containmultiple channels of data. In this example, each channel is located at adifferent wavelength. The low-speed ports 1202,1212 handle singlechannels of data. The wavelength division demultiplexer 1252 splits theincoming multi-channel signal into its constituent channels, which thenenter the optical switch 1254. The wavelength division multiplexer 1256combines channels from the optical switch 1254 into a single,multi-channel optical signal. The optical switch 1254 routes the variouschannels between the various ports.

As with systems 1000 and 1100, node 1200 also include optical amplifiers400, which may be located in many different places. The opticalamplifiers 400 include early warning failure detection and generateearly warning signals 445. These signals 445 are routed to managementsystem 1240, which monitors the status of the optical amplifiers 400 andtakes appropriate actions when an early warning signal 445 indicatesfuture failure.

FIGS. 10-12 depict specific implementations of a transmitter, receiverand switching node, but these are intended only as examples. Inaddition, early warning failure detection can also be used in othertypes of transmitters, receivers and switching nodes; in othercomponents of fiber communication systems; as well as in otherapplications which utilize optical amplifiers. For example, opticalamplifiers are often used to amplify signals traveling long distancesthrough fibers. The early warning failure detection described above canbe used in these systems also.

As another example, the early warning failure detection described abovecan also be used during the manufacture of optical devices, includingtesting of devices. For example, early warning failure detection can beused to implement wafer scale testing of devices which include VLSOAs.That is, these devices can be tested while still in wafer form, withouthaving to first dice or cleave the wafer or singulate the devices. Thefailure detection mechanism can be used to identify already failed orabout to fail devices on the wafer, which can then be discarded duringsubsequent processing.

Although the invention has been described in considerable detail withreference to certain preferred embodiments thereof, other embodimentswill be apparent. Therefore, the scope of the appended claims should notbe limited to the description of the preferred embodiments containedherein.

1. A detection system suitable for use in connection with analysis ofthe performance of an optical device, the detection system comprising:an optical filter configured to receive a ballast laser signal from theoptical device, the ballast laser signal having a wavelength, and aspectral response of the optical filter varying with the wavelength ofthe ballast laser signal; and a detector configured to receive at leasta portion of the ballast laser signal from the optical filter, and thedetector further configured to generate and transmit an electricalsignal corresponding to the portion of the ballast laser signal receivedfrom the optical filter.
 2. The detection system as recited in claim 1,wherein the optical filter is selected from the group consisting of:thin-film resonant cavity filters; thin-film multicavity filters; and,arrayed waveguide grating type filters.
 3. The detection system asrecited in claim 1, wherein the optical filter is selected for aspectral response which facilitates detection of a shift in the ballastlaser signal wavelength.
 4. The detection system as recited in claim 1,wherein the optical filter comprises a Fabry Perot optical filter. 5.The detection system as recited in claim 1, wherein the detector isselected from the group consisting of: avalanche photodetectors; and,positive-intrinsic-negative diodes.
 6. The detection system as recitedin claim 1, wherein the optical filter has an associated pass band andstop band defined such that an operating wavelength λ of the ballastlaser signal lies substantially in the stop band and a post shiftwavelength λ+δ of the ballast laser signal lies substantially in thepass band.
 7. The detection system as recited in claim 1, wherein theoptical filter has an associated pass band and stop band defined suchthat an operating wavelength λ of the ballast laser signal liessubstantially in the pass band and a post shift wavelength λ+δ of theballast laser signal lies substantially in the stop band.
 8. Thedetection system as recited in claim 1, wherein the optical filter hasan associated pass band and stop band defined such that an operatingwavelength λ of the ballast laser signal lies substantially in the stopband and a post shift wavelength λ−δ of the ballast laser signal liessubstantially in the pass band.
 9. The detection system as recited inclaim 1, wherein the optical filter has an associated pass band and stopband defined such that an operating wavelength λ of the ballast lasersignal lies substantially in the pass band and a post shift wavelengthλ−δ of the ballast laser signal lies substantially in the stop band. 10.The detection system as recited in claim 1, wherein a change in astrength of the electrical signal corresponds to a shift in thewavelength of the ballast laser signal.
 11. An evaluation systemsuitable for use in connection with analysis of the performance of oneor more optical devices, the evaluation system comprising: a comparatorconfigured to generate an output signal corresponding to a comparison ofa first input signal and an early warning input signal received,respectively, at first and second signal inputs of the comparator, theearly warning input signal comprising one of: a signal corresponding toa ballast laser signal generated by a first optical device; or, a signalcorresponding to a pump current input to the first optical device; and aprocessor configured to receive the output signal from the comparatorand to perform a predetermined action if the received output signalindicates the presence of a particular relationship between the firstinput signal and the early warning input signals.
 12. The evaluationsystem as recited in claim 11, wherein the first input signal comprisesone of: a reference threshold; and, a second early warning input signal.13. The evaluation system as recited in claim 11, wherein the firstinput signal comprises a signal corresponding to a ballast laser signalgenerated by a second optical device, and the early warning input signalcomprises a signal corresponding to a ballast laser signal generated bythe first optical device.
 14. The evaluation system as recited in claim11, wherein the particular relationship comprises a relationship where adifference between the first input signal and the early warning inputsignal falls outside an acceptable range.
 15. The evaluation system asrecited in claim 11, further comprising an early warning failureindicator, and the predetermined action comprising activating the earlywarning failure indicator.
 16. A system suitable for use in connectionwith analysis of the performance of an optical device, the systemcomprising: a detection system, comprising: an optical filter configuredto receive a ballast laser signal from the optical device, the ballastlaser signal having a wavelength, and a spectral response of the opticalfilter varying with the wavelength of the ballast laser signal; and adetector configured to receive at least a portion of the ballast lasersignal from the optical filter, and the detector further configured togenerate and transmit an electrical signal corresponding to the portionof the ballast laser signal received from the optical filter; and anevaluation system in communication with the detection system andcomprising: a comparator configured to generate an output signalcorresponding to a comparison of first and second input signalsreceived, respectively, at first and second signal inputs of thecomparator, the first input signal comprising the electrical signaltransmitted by the detector; and a processor configured to receive theoutput signal from the comparator and to perform a predetermined actionif the received output signal indicates the presence of a particularrelationship between the first and second signals.
 17. The system asrecited in claim 16, wherein the optical filter has an associated passband and stop band defined such that an operating wavelength λ of theballast laser signal lies substantially in the stop band and a postshift wavelength λ+δ of the ballast laser signal lies substantially inthe pass band.
 18. The system as recited in claim 16, wherein theoptical filter has an associated pass band and stop band defined suchthat an operating wavelength λ of the ballast laser signal liessubstantially in the pass band and a post shift wavelength λ+δ of theballast laser signal lies substantially in the stop band.
 19. The systemas recited in claim 16, wherein the optical filter has an associatedpass band and stop band defined such that an operating wavelength λ ofthe ballast laser signal lies substantially in the stop band and a postshift wavelength λ−δ of the ballast laser signal lies substantially inthe pass band.
 20. The system as recited in claim 16, wherein theoptical filter has an associated pass band and stop band defined suchthat an operating wavelength λ of the ballast laser signal liessubstantially in the pass band and a post shift wavelength λ−δ of theballast laser signal lies substantially in the stop band.
 21. The systemas recited in claim 16, wherein a change in a strength of the electricalsignal corresponds to a shift in the wavelength of the ballast lasersignal.
 22. The system as recited in claim wherein the second signalcomprises a reference threshold.
 23. The system as recited in claim 16,wherein the predetermined relationship comprises a relationship where adifference between the early warning signal and the second signal fallsoutside an acceptable range.
 24. A system suitable for use in connectionwith analysis of the performance of an optical device, the detectioncomprising: a warning signal source configured to generate and transmitan early warning signal concerning one of: a ballast laser signalgenerated by the optical device; and, a pump current input to theoptical device; and an evaluation system in communication with thewarning signal source and comprising: a comparator configured togenerate an output signal corresponding to a comparison of the earlywarning signal and a second input signal received, respectively, atfirst and second signal inputs of the comparator; and a processorconfigured to receive the output signal from the comparator and toperform a predetermined action if the received output signal indicatesthe presence of a particular relationship between the early warningsignal and the second signals.
 25. The system as recited in claim 24,wherein the predetermined relationship comprises a relationship where adifference between the early warning signal and the second signal fallsoutside an acceptable range.
 26. The system as recited in claim 24,wherein the early warning signal concerns the wavelength of a filteredportion of the ballast laser signal.
 27. The system as recited in claim24, wherein the early warning signal source comprises a detectorconfigured to receive the ballast laser signal from the optical device.28. The system as recited in claim 24, wherein a change in strength ofthe early warning signal corresponds to a shift in the wavelength of theballast laser signal.
 29. The system as recited in claim 24, wherein thesecond signal comprises a reference threshold.
 30. An optical amplifier,comprising: a lasing semiconductor optical amplifier comprising: asemiconductor gain medium that defines an amplifying path; a lasercavity that includes the semiconductor gain medium; and a pump input tothe semiconductor gain medium, the pump input being configured to enablethe use of a pump current to pump the semiconductor medium above alasing threshold associated with the laser cavity so that a ballastlaser signal is produced by the laser cavity; and a detector configuredto receive the ballast laser signal and to generate an electrical signalcorresponding to the ballast laser signal, the electrical signal and apump current parameter at least partially defining a basis for failureanalysis of the lasing semiconductor optical amplifier.
 31. The opticalamplifier as recited in claim 30, wherein the failure analysis is basedupon a substantially constant pump current, and variations occurring ina wavelength of the ballast laser signal.
 32. The optical amplifier asrecited in claim 30, wherein the failure analysis is based upon asubstantially constant ballast laser signal wavelength, and variationsoccurring in the pump current.